Job Description
As part of global Design teams, you will help bring new microprocessor-based SoC designs from initial test requirements through DFT structural test pattern generation and debug, and into full-scale production.
Your responsibilities will include:
- Specifying and creating test patterns, pre-silicon verification, pattern conversion to ATE, and post-silicon pattern debug.
- Supporting the Test Engineering team with patterns for manufacturing test, qualification, yield enhancement, and product performance analysis.
- Serving as a key interface between Design, Test Engineering, Product Engineering, and Fab teams.
- Specifying, implementing, and validating built-in test features, and delivering all DFT test patterns for the product.
Qualifications
- Recent graduate (0-2 years) with a Bachelor's or Master's degree in Engineering: EE, Computer Engineering, CS, EET, or equivalent.
- Proficiency in Python, Verilog, Perl, Tcl, and Unix.
- Experience with multiple aspects of structural test design, ATPG, test coverage, fault universe, JTAG, BSDL, memory and logic BIST, and DFT logic.
- Knowledge or experience with ATPG/DFT tools such as FastScan, LBIST, MBIST, DFTCompiler, etc.
- Semiconductor testing experience.
- ATE VLSI tester programming and usage (J973, Tiger/Catalyst, UltraFex, or Verigy 93000) is a plus.
- Knowledge or experience with functional pattern test.
- Excellent oral and written communication skills, with the ability to partner with team members from other departments, disciplines, and cultures.
- Proven track record of working with minimal direction while meeting schedules.
- Ability to multi-task and prioritize tasks to meet customer needs.